Gen Precision Launches Automated Inspection Machine for FAU Series Components Supporting Scalable CPO Manufacturing

June 22, 2026
Gen Precision launches GTK-OSI1, an automated inspection machine for FAU, FA, V-Groove, MT and MMC ferrules, supporting high-accuracy optical component inspection for scalable CPO manufacturing.

Driven by therapid expansion of AI infrastructure, demand for Fiber Array Units (FAUs) andother passive optical components is increasing across silicon photonics andco-packaged optics (CPO) applications. As production volumes grow,manufacturers face increasing demands for inspection accuracy and efficiencyacross components including Fiber Array (FA), V-Grooves (VG), MT ferrules, andMMC ferrules.

To address thesechallenges, Gen Precision announced the GTK-OSI1 Automated Passive Optical Component Inspection Machine, which integrates AOI, AI-powered imageanalysis, and high-precision measurement technologies. Featuring Smart-PointSetup and a proprietary Geo-Trajectory Algorithm, the system supportsautomated, high-efficiency inspection of FAUs and other passive opticalcomponents.

See the GTK-OSI1 machine on-site at CFCF 2026
Learn MOre

Dual-CCD Vision System Enables Micron-Level Measurement Accuracy

Silicon photonics applications require increasingly tighter dimensional tolerances, making inspection accuracy critical to manufacturing yield. The GTK-OSI1 features an18-megapixel dual-CCD vision system that separates feature recognition and precision measurement into dedicated inspection processes.

The GTK-OSI1 achieves measurement repeatability of up to 3σ ±0.05 μm for Fiber Arrays (FA)and V-Grooves (VG), and 3σ ±0.1 μm for MT and MMC ferrules. Beyond meeting current inspection standards, this product is designed with tomorrow in mind.It scales to support the ultra-high-density measurement needs of next-generation optical communications, such as 6.4T and 12.8T modules, ensuring an equipment investment that delivers immediate value and long-term scalability.

Smart-Point Configuration and Semiconductor-Grade Positioning for High-Volume Inspection

The GTK-OSI1 incorporates semiconductor-grade, three-axis positioning technology and Smart-Point Configuration to automatically locates and measures critical features. Combined with dedicated fixtures, it supports a wide range of passive optical components while minimizing setup requirements across different product types.

Leveraging the proprietary Geo-Trajectory Algorithm, for the GTK-OSI1 can inspect up to 20 MT or MMC ferrules in a single cycle, completing individual hole or groove measurements in less than one second. By integrating automated positioning with this batch inspection, the system enables manufacturers to increase throughput without compromising measurement repeatability.

Developed from practical experience in precision machining, automation equipment development,and passive optical component manufacturing, the GTK-OSI1 integrates measurement accuracy, automated processing, and batch inspection into a standardized machine designed for volume production.

Explore a smarter way to inspect passive optical components
Learn More